Chips · Equipment
Metrology & Inspection
Defect inspection and measurement systems used throughout the fab. KLA (US) ~55-63%, Hitachi High-Tech (JP), Onto Innovation (US), Nova (IL).
Equipment for
The map, filtered to who makes this.
Who makes it, by country20 on the index
- Japan5
- United States4
- China3
- South Korea3
- Israel2
- Germany1
- Switzerland1
- France1
By result
- Clear15
- Caution2
- Flagged0
- Blocked3
- Not screened0
Results under CHIPS and export controls. What each result means
Where they are
Makers on the index
All 20 on the map →- Bruker Corporation (Nano Surfaces & Metrology)Billerica, MA, United StatesClear
- Camtek Ltd.Migdal HaEmek, IsraelClear
- Carl Zeiss SMT GmbHOberkochen, GermanyClear
- Comet Yxlon (Comet Holding AG)Flamatt, SwitzerlandClear
- Dongfang Jingyuan (East Crystal Source / EBTC)Beijing, ChinaBlocked
- Hitachi High-Tech CorporationTokyo, JapanClear
- Horiba, Ltd.Kyoto, JapanClear
- JEOL Ltd.Tokyo, JapanClear
- KLA CorporationMilpitas, CA, United StatesClear
- Koh Young Technology Inc.Seoul, South KoreaCaution
- Lasertec CorporationYokohama, JapanClear
- Nextin Inc.Hwaseong, South KoreaClear